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Magazine Name : Ieee Transactions On Computers

Year : 1981 Volume number : 30 Issue: 11

A Design Of Programmable Logic Arrays With Universal Tests (Article)
Subject: Easily Testable Design , Fault Detection , Fault Location , Logic Circuits
Author: Hideo Fujiwara      Kozo Kinoshita     
page:      823 - 828
A Hardware Approach To Self-Testing Of Large Programmable Logic Arrays (Article)
Subject: Built-In-Test (Bist) , Nonlinear Feedback Shift Registers , Pattern Generation , Programmable Logic Array
Author: Joachim Mucha      Wilfried Daehn     
page:      829 - 833
A Testable Design Of Iterative Logic Arrays (Article)
Subject: C-Testability , Fault Detection , Fault Diagnosis , Flow Table Augmentation
Author: Sudhakar M. Reddy      R. Parthasarathy     
page:      833 - 841
Design Of Easily Testable Bit-Sliced Systems (Article)
Subject: Design For Testability , Fault Modeling , Self-Testing , Test Generation
Author: John P Hayes      Thirumalai Sridhar     
page:      842 - 854
Multiple Fault Testing Of Large Circuits By Single Fault Test Sets (Article)
Subject: Capability Of Single Fault Test Sets , Coverage Bounds , Coverage Table , Generic Name
Author: Vindo K Agarwal      Thirumalai Sridhar     
page:      855 - 865
Design For Autonomous Test (Article)
Subject: Built-In-Test (Bist) , Design For Testability , Exhaustive Testing , Partitioning
Author: Edward J. Mccluskey      Saied Bozorgui-Nesbat     
page:      866 - 875
Design Of Testable Structures Defined By Simple Loops (Article)
Subject: Design Augmentation , Self-Checking Systems , Testing , Tree Structured Belief Network
Author: Jacob A Abraham      Daniel D Gajski     
page:      875 - 884
New Measures Of Testability And Test Complexity For Linear Analog Failure Analysis (Article)
Subject: Automatic Test Program Generation , Fault Diagnosis Experiment Design , Testability Measure , Test Complexity Measure
Author: Robert W. Priester      James B. Clary     
page:      884 - 888
Diagnosability Of Nonlinear Circuits And Systems - Part I: The Dc Case (Article)
Subject: Input-Output Model , Circuits , Genericity , Jacobian
Author: V. Visvanathan      Alberto Sangiovanni-Vincentelli     
page:      889 - 898
Diagnosability Of Nonlinear Circuits And Systems - Part Ii: Dynamical Systems (Article)
Subject: Dynamical Systems , Hilbert Space , Measure , Adjoint Map
Author: Alberto Sangiovanni-Vincentelli      V. Visvanathan      Richard Saeks     
page:      899 - 904